Experience true innovation—at your desk.
Discover the latest technologies, best practices, and application trends for measurement, test, and embedded systems.
Find the tools and knowledge you need. Virtual NIDays brings you some of the most popular sessions from NIWeek and NIDays.
Watch the sessions from the convenience of your home or office, by yourself or in the company of your colleagues, and learn how you can save time and money, improve productivity, and solve your engineering challenges with NI’s platforms.
On the go at this time, you can enjoy the sessions by installing the Adobe Connect App on your mobile, tablet or PC. Download the app here.
13 - 15 December 2016
Live and Free Webinars
Singapore/Manila: 9am and 11am SGT
Sydney: 12nn and 2pm AEDT
Auckland: 2pm and 4pm NZDT
45 mins + 5 - 10 mins Q&A
What’s New in LV 2016/Future of LabVIEW (Introductory)
13 December 2016 | 9:00 AM SGT / 12:00 NN AEDT
If there were ever a year to attend NIWeek, 2016 is the year. If there were ever a year to attend a session on the future of LabVIEW, 2016 is the year.
In this session, we’ll delve into the future of LabVIEW – and go far beyond high-level slides and categorical investment arcs. Whether you open LabVIEW every day at work, LabVIEW is but one of the tools in your toolbox, or LabVIEW is merely a hobby of yours, you won’t want to miss this session.
The BIG, the BAD, and the UGLY: Big Data Best Practices for Data Acquisition (Introductory)
13 December 2016 | 11:00 AM SGT / 2:00 PM AEDT
Data acquisition systems are producing more analog data than ever before. This opportunity to uncover new insight comes at the risk of spending more time searching for and analyzing multiple data sets.
Learn how proper metadata documentation, custom triggering, implementing the right analysis technique, and conditional logging help to save only the data you need to make informed decisions.
5 Disruptive Technologies You Need to Know About in Automated Test (Introductory)
14 December 2016 | 9:00 AM SGT / 12:00 NN AEDT
Technology’s integration in automated test systems is always evolving. Harnessing these technologies as they are introduced is imperative to continuously drive down test cost and test times and maintain a competitive advantage. Significant advances in processors, high-speed communication interfaces, data converters, FPGAs, and big analog data management are changing the everyday activities of test engineers around the world.
At this session, explore the technology trends that will affect the future of the automated test industry.
Introduction to Digital Pattern Instruments for Semiconductor Functional Test (Introductory)
14 December 2016 | 11:00 AM SGT / 2:00 PM AEDT
NI has introduced the first ever modular instrument that implements the digital test paradigm and features of semiconductor production testers. This instrument is a monumental improvement in connecting the workflow and data of characterization and production engineers in semiconductor.
At this session, learn how NI software and hardware can become your preferred ATE and how the new digital pattern instrument can improve your tests and test data.
The Future of Standard Ethernet: Industrial IoT Convergence With the Control System (Intermediate)
15 December 2016 | 9:00 AM SGT / 12:00 NN AEDT
The IEEE 802 standards group has added new capabilities to the Ethernet standard that allow regular IT traffic to converge with time-sensitive control traffic. At this session, explore the new capabilities of the Ethernet infrastructure that support time synchronization, low-latency communications, and high-network reliability.
Beyond Inspection: Unlocking Performance for Vision on The CompactRIO Platform (Advanced)
15 December 2016 | 11:00 AM SGT / 2:00 PM AEDT
Vision plays a key role in quality control, traceability, and alignment for many Industrial Internet of Things applications. The motion control and measurement systems in these applications often share and synchronize visual data. With the unrivaled performance and integration capabilities of CompactRIO, you can combine machine vision and motion control subsystems within the same controller to improve performance and simplify overall system complexity.
At this session, learn about the unique capabilities of the CompactRIO platform for vision applications.
Keynote Part 1: Disrupting Test, Measurement and Control with a Platform and Ecosystem
Explore how NI’s strong investment in R&D continues to deliver breakthrough innovations for our industry-leading platform for test, measurement, and control. Through visionary leadership and customer feedback, witness how the NI platform is enabling cutting-edge technology advances in application areas including semiconductor test, materials research, hardware-in-the-loop test, automotive radar, massive MIMO design, mmWave prototyping, and time sensitive networking. Also gain a look into what will be possible with future NI software through the NI Software Technology Preview.
Keynote Part 2: Paving the Way for Technological Innovation with NI’s Ecosystem
Engineers and scientists are harnessing the power of the NI platform, augmented by the vibrant ecosystem of partners and 3rd party IP, to overcome the challenge of converging technologies in test, measurement, and control applications. Explore impressive applications and innovative approaches to engineering challenges from industry leaders and partners that harness the power of a platform based approach.
DAQ Advanced: PXI Synchronization Under the Hood
Several methods exist for synchronizing devices, depending on the devices involved and the requirements of the application. The NI-DAQmx driver simplifies the timing and control of multiple devices based on how your system is configured in software. This session examines the underlying hardware architecture of different PXI and PXI Express synchronization methods. Learn how different clock and trigger signals in the backplane and timing and synchronization modules are managed to accurately synchronize multiple chassis.
From the Experts: Automated Test Best Practices
Obtain best practices for building automated test systems, from analyzing test requirements and developing the tester architecture to optimizing test throughput and deploying test systems. This session is based on NI's Practical Guides for Building a Test System series, which were written in collaboration with various leading companies in the Automated Test industry.
Built for Speed: How to Optimize SMUs for High-Throughput DC Testing
High-precision DC measurements frequently need a long measurement cycle to ensure proper signal integrity. However, many of these measurements are unnecessarily throttled because of software overhead, long settling times, or inefficient measurement engine use. Learn how to optimize source measure units (SMUs) for test throughput while maintaining an acceptable level of precision.
Tomorrow's Wireless: How 5G and the IoT are Changing the Future of Wireless
From 1G to 4G, requirements such as better voice coverage and mobile broadband significantly pushed the technical capabilities of mobile communications systems. Going forward, 5G is evolving based on a new set of requirements. Megatrend realities such as the IoT and even more mobile broadband are pushing 5G requirements into an increasingly diverse set of requirements. In this paper we will explain the technical requirements driving 5G, and explain how technologies such as massive MIMO, millimeter wave communications, and multi-RAT wireless systems will address them. In addition, we will provide an update on the 5G standardization process – providing an overview of the physical layer characteristics of the first and second of 5G deployments. In addition, we'll provide an overview of how Wi-Fi, NFC, and other technologies are also evolving to serve the changing needs of wireless communications systems.
Overview of 5G: Addressing the Requirements of Next Generation Wireless Communications Systems
From 1G to 4G, requirements such as better voice coverage and mobile broadband significantly pushed the technical capabilities of mobile communications systems. Going forward, 5G is evolving based on a new set of requirements. Megatrend realities such as the IoT and even more mobile broadband are pushing 5G requirements into an increasingly diverse set of requirements. In this presentation, we will explain the technical requirements driving 5G, and explain how technologies such as massive MIMO, millimeter wave communications, and multi-RAT systems will address them. In addition, we will provide an update on the 5G standardization process – providing an overview of the physical layer characteristics of the first and second of 5G deployments.
Simplify System Design With CompactRIO: The Ultimate Multipurpose Controller
Designing control and I/O systems for industrial machinery and advanced equipment is no small task. Design teams must deliver profitable and differentiated products while meeting stringent technical requirements and tight schedules. At this session, learn how you can improve the way you design and deploy advanced control and monitoring systems for the Industrial Internet of Things by taking advantage of the unrivaled performance and flexibility of the CompactRIO platform.
Processing at the Edge: Why a Platform-Based Approach Is Ideal for the Industrial Internet of Things
Are you ready to implement the Industrial Internet of Things? This technology revolution is more than just a vision or a trend; it is here today -- and here to stay. But this revolution does not come without challenges; control and monitoring systems for the Industrial Internet of Things are becoming more complex, requiring a platform-based approach that overcomes obstacles and scales with evolving requirements over time.
In this session, you will learn about the incredible opportunities being created by this migration towards smarter devices, processes, and infrastructure. We will discuss the fundamentals of the Industrial Internet of Things -- which begins at "the edge" -- and how the LabVIEW Reconfigurable I/O (RIO) architecture will enable you to design, prototype, and deploy complex embedded control and monitoring systems for IIoT applications.
Furthermore, learn what new technology National Instruments is introducing that will accelerate your productivity and drive rapid innovation in the Industrial Internet of Things.