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NI Technical Symposium Session Descriptions

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Keynote Presentation: You and NI Together, you and NI are redefining the ways in which engineers solve key business applications like production test, data acquisition, and embedded control and monitoring while striving to find insight in data. The keynote will feature live demonstrations of newly released products and inspiring real-life customer applications that are making Industry 4.0 and Cyber Physical Systems a reality. Join us as we explore the latest technologies driving this evolution and see how NI's powerful, hardware and software offering can tailor to your needs, now and in the future.
Don't think you need an FPGA? Think again! FPGAs are at the heart of a wide range of applications, from data loggers to particle accelerators. However, many system designers are unfamiliar with these incredibly powerful and reconfigurable chips and the benefits they could deliver to their applications. In this session, learn how you can easily harness the performance, reliability and flexibility of FPGAs without prior knowledge of hardware description languages like VHDL or Verilog.
What's New in LabVIEW 2014 Discover the significant improvements LabVIEW 2014 makes in the areas of acquiring, analyzing, and visualizing data so that you can take any data set and make an informed decision fast.
Introduction to Automating Standalone Instruments Every day, engineers work with a variety of benchtop instruments from oscilloscopes to more specialised instruments such as radiometers. Explore connectivity options including GPIB, USB and Ethernet and learn how to get started automating multiple measurements quickly with LabVIEW and certified instrument drivers.
Instrument UI Comparison: VirtualBench Versus Traditional Instruments Which is better: knobs and buttons or software user interfaces? Find out in this session by watching us test and characterise a circuit with both VirtualBench and a set of traditional instruments side-by-side.
5 Red Flags to Consider for Configuring Measurement Systems By design, the configuration-based model for data acquisition is often the quickest way to get to initial results, but the long-term tradeoffs may outweigh the early returns. Development time, software functionality and maintenance all depend on this crucial decision early in the development process.  This session explores the benefits and tradeoffs of both approaches, detailing the application requirements that may drive your decision and highlighting best practices for alleviating risks associated with custom software.
Choosing the right Data Acquisition Platformand Making the Most of It True experimentation should be lead by the results needed not the measurement hardware provided. But no engineer has the budget or space to have infinite hardware options to hand. This session introduces the NI DAQ platforms and explains the trade-offs made when choosing hardware for your measurement application by exploring both the advantageous technologies available, and platform limitations, to ensure you invest in the correct device.
New Enterprise Solution for Condition Monitoring Applications Learn about NI’s new enterprise software suite for online condition monitoring to gain insight into the health of rotating machinery and improve maintenance programs. NI InsightCM(tm) Enterprise integrates ready-to-deploy hardware and software that acquires condition indicators, handles management and analysis of analog data, and offers remote systems management to monitor health and simplify deployment and configuration on 100s of CompactRIO systems at once.
Next Generation Test Hardware Architecture Join us for a sneak preview of next generation test hardware architectures. This session will include side-by-side product comparisons to meet your most stringent test needs.
New Software Designed Instruments Today's incredibly complex products require an ever-growing amount of test. Traditional test instruments aren't proportionally scaling to keep up. Each subsequent generation of technology includes more pieces and more sophisticated technology and the cost of using traditional instrumentation to test these devices is only increasing. Learn how customizing your test instrumentation through the user-programmable FPGA in software-designed instrumentation can enhance your test systems.
Are MI Right for Me? An Introduction to Modular Instrumentation Does your current test architecture meet your quality and cost goals while keeping up with growing product complexity? If it is time for a change but you don’t know where to start, attend this session to demystify the conversion to a modular testing approach and see how it can better meet your test needs.
Simplifying System Design with the new compactRIO The newest CompactRIO controller delivers unrivaled performance and a diverse feature set, including improved integration with vision systems and integrated display output. Discover how this new CompactRIO controller--based on an Intel Atom processor, the latest Xilinx Kintex-7 FPGA and NI Linux Real-Time--can outperform the competition and simplify the design of your next embedded system.
Introduction to PXI Explore the PXI platform and learn how it has evolved over the years to help thousands of companies meet their test, measurement, and control needs. Also get a sneak peek at new products and customer solutions.
Advances in RF and Microwave Measurement Technology Take a look at NI's biggest RF launch of 2014. We are taking PXI beyond 20 GHz in both generation and analysis w/ real-time analysis bandwidth exceeding 500 MHz. The spectral performance is designed to meet the challenging requirements of modern RF & Microwave test. Don't miss this opportunity to learn about these brand new products.
Tips for Code Re-use - Bringing Your.dll, .m, and .mdl Files into the LabVIEW Fold Got code that you want to reuse? At this session, discover how to integrate different models of computation within LabVIEW. Learn how to incorporate C DLLs and .NET assemblies along with your .m algorithms and .mdl models into the LabVIEW environment. Example applications include embedded systems, automated test, RF/communications, and control systems.


Test Drive Stations  
Test-Drive LabVIEW and CompactDAQ
for Computer-Based Measurements
CompactDAQ is a portable, rugged DAQ platform that integrates connectivity and signal
conditioning into modular I/O for directly interfacing to any sensor or signal. The breadth
of bus, chassis, and I/O conditioning options combined with the customisable nature of
LabVIEW software provide the best solution to meet the needs of your medium-channel-
count application.
Test-Drive LabVIEW Real-Time, LabVIEW FPGA and CompactRIO
for Embedded Monitoring and Control
NI CompactRIO combines an open embedded architecture with small size, extreme
ruggedness, hot-swappable industrial I/O modules, and is powered by the LabVIEW
reconfigurable I/O (RIO) architecture.