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RF and Microwave Test, Measurement and Design Technology Roadshow

RF Roadshow
Join RF experts from National Instruments and AWR as we explore the functionality and capabilities of new technologies that are changing the way we approach RF Test, Measurement and Design applications, including RF Record and Playback, RADAR, MIMO, and Spectrum Monitoring.

Learn about the latest industry leading software, and new PXI-based RF Instruments with best-in-class Performance, and how adopting this technology can lower capital cost, save benchtop & floor space, increase throughput and adapt to a variety of test and measurement requirements.

Also, gain insight into system design techniques, such as harnessing the latest FPGA technologies, to adapt instrumentation to your application requirements.

Admission is FREE! Register now to reserve your place.


Date Venue
Sydney 5 Mar Register Now
Canberra 6 Mar Register Now
Auckland 12 Mar Register Now
Adelaide 18 Mar Register Now
Melbourne 20 Mar Register Now


Who should Attend?

This event is intended for RF and microwave engineers and scientist involved in all phases of the product life cycle – from design and verification to production and  field measurements.

Attendee Benefits

  •  Discover the advantages of software-defined, modular instrumentation
  • Learn key considerations, time-saving tips and advanced testing techniques
  • Talk with experts about your specific design and test challenges


Time Session Title
8:30-9:00am             Registration

Introduction - Revolutionising RF and Microwave Test, Measurement and Design with a Modular Approach.

Learn about the advantages and capabilities of building RF systems using a modular software-defined architecture that gives you the ability to select individual RF instruments and build a custom system with a new level of flexibility and performance.


Advanced Technologies for RF Record, Playback & MIMO Applications

As test and measurement requirements continue to increase in complexity, new instrumentation paradigms are required. With the architectural design of PXI systems, these instruments can create a wide range of embedded applications. Learn how advanced PXI technologies such as data streaming make it possible to record and playback signals both to and from disk. This session also looks at the PXI platform in detail, how it harvests FPGA’s, tight synchronisation and streaming technologies and how RF and microwave instrumentation is being redefined with an approach that achieves industry-leading speed, accuracy and flexibility.


Design Flow with AWR Microwave Office

This presentation gives an overview of AWR’s unique integrated RF and microwave design flow as well as AWR's product range and its key features. Demonstrations will outline the use model of a typical RF design flow while displaying the use of AWR’s products.

10:50am-11:10am Morning Tea
11:10am- 11:50am

Advanced VNA Measurements

The vector network analyser (VNA) has become the instrument of choice for many RF measurements due to its exceptional accuracy and flexibility. They are powerful instruments that, when properly used, provide unparalleled accuracy. With the introduction of the NI PXIe-5632 Vector Network Analyser (VNA) for example, engineers and scientists can now include network analysis in design validation and production lines without the high cost or large footprint of traditional network analyzers. During this session, we will explore the architecture of the latest VNAs, their software environment, SOLT Techniques, measurements made by VNAs and some of the more advanced features and capabilities available


Linking RF Design, Simulation and Test for Radar Applications

Modern radar system analysis needs to account for both the performance of the electronic system as well as modeling the target in its environment. Many modulation types are available to the radar system designer such as short pulse, long pulse, ICWFM, short and long pulse Chirp. Each modulation type is associated with different radar modes, for example short range target tracking, track while scan, target illumination, etc. This presentation will outline the use of the integrated NI and AWR solution for measurements in the design flow, including AWR’s Visual System Simulator™ (VSS) and its Radar Library.

12.40pm–  1.20pm
1.20pm – 2.05pm

Introduction to Spectrum Monitoring Receivers

Spectrum monitoring receivers are unique signal analyzers designed to capture off-the-air signals and demodulate them.  In this session, you'll learn about how spectrum monitoring receivers are able to separate a signal of interest from high-power interferers using pre-selection and IF-roofing filters.  In addition, you'll learn about how FPGA-based technology can be used to real-time signal processing and demodulation.

2.05pm – 2.35pm

What’s New in Microwave Office V11

During this session, AWR will show features of the upcoming V11 release of the AWR Design Environment™. It examines how the new release helps users to improve design accuracy, increase their own productivity and therefore reduce time to market. Demonstrations will cover the use model of AWR’s newest product addition, the 3D finite element method electromagnetic solver named Analyst.

2.35pm – 2.45pm Wrap up and Conclusion


 Register Now



Free Call:

(AU) 1800 300 800,
(NZ) 0800 553 322


Additional Resources:


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RF Demos & Tutorials

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RF Measurements Fundamental Webcast Series

Learn the fundamentals of making and optimizing RF measurements.

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RF Training

RF Services & Training

With NI, you have the assurance of ongoing technology training, support, and service programs for individual engineers, global organizations, integrators, and OEMs

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